Prof.Anand Krishna Asundi
Nanyang Technological University, Singapore
时间：2016年9月30日 上午9:00-10:30
地点：基础教学楼A座317
Anand Asundi graduated from the Indian Institute of Technology, and received his Ph.D. from the State University of New York. Currently he is Professor and Deputy Director of the Advanced Materials Research Centre at the Nanyang Technological University. His research interests are in Photomechanics and Optical Sensors. He has published over 200 papers in peer-reviewed journals. He is Editor ofOptics and Lasers in Engineeringand on the Board of Directors of SPIE. He is also Chairman of the Asian Committee on Experimental Mechanics and the Asia Pacific Committee on Smart and Nano Materials both of which he co-founded.
Abstract:3D measurement and inspection is an area with growing needs and interest. We need to measure both rough and smooth objects which are transparent or reflecting and with resolutions ranging from nanometers to millimeters. While no one method can achieve all these features – there has been an evolution of metrology methods starting with methods using Geometric Optical Principles such as Fringe Projection and Reflectometry to Interferometric methods such as Digital Holography and back to non-interferometric methods such as Transport of Intensity and Light Field. In this talk, Prof，asundi take you down this history path using technologies and systems which are available commercially.
